Deviations from plastic barriers in Bi2Sr2CaCu2O8+δ thin films
Abstract
Resistive transitions of an epitaxial Bi2Sr2CaCu2O8+δ thin film were measured in various magnetic fields (H c), ranging from 0 to 22.0 T. Rounded curvatures of low resistivity tails are observed in Arrhenius plot and considered to relate to deviations from plastic barriers. In order to characterize these deviations, an empirical barrier form is developed, which is found to be in good agreement with experimental data and coincide with the plastic barrier form in a limited magnetic field range. Using the plastic barrier predictions and the empirical barrier form, we successfully explain the observed deviations.
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