Length-dependent resistance model for a single-wall Carbon nanotube
Abstract
The non-linear length-dependent resistance, R(l) observed in single-wall Carbon nanotubes (SNTs) is explained through the recently proposed ionization energy (EI) based Fermi-Dirac statistics (iFDS). The length here corresponds to the Carbon atoms number (N) along the SNT. It is also shown that Ry(ly) < Rx(lx) is associated with EIy < EIx, which can be attributed to different semiconducting properties in their respective y and x directions.
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