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Quantitative measurements of the thermal resistance of Andreev interferometers

Z. Jiang, V. Chandrasekhar

cond-mat.mes-hallarXiv:cond-mat/0501478

Abstract

Using a local thermometry technique, we have been able to quantitatively measure the thermal resistance RT of diffusive Andreev interferometers. We find that RT is strongly enhanced from its normal state value at low temperatures, and behaves non-linearly as a function of the thermal current through the sample. We also find that the RT oscillates as a function of magnetic flux with a fundamental period corresponding to one flux quantum Φ0=h/2e, demonstrating the phase coherent nature of thermal transport in these devices. The magnitude of RT is larger than predicted by recent numerical simulations.

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