Characteristics of strong ferromagnetic Josephson junctions with epitaxial barriers
C. Bell, R. Loloee, G. Burnell, M. G. Blamire
Abstract
We present the measurement of superconductor / ferromagnetic Josephson junctions, based on an epitaxial Nb bottom electrode and epitaxial Fe20Ni80 barrier. Uniform junctions have been fabricated with a barrier thicknesses in the range 2-12 nm. The maximum critical current density ~ 2.4 0.2 * 109 Am-2 was found for a devices with a 3 nm thick barrier at 4.2 K, corresponding to an average characteristic voltage IC RN ~ 16 μV. The IC RN showed a non-monotonic behavior with Fe20Ni80 thickness. The variation of the resistance of a unit area ARN, of the junctions with barrier thickness gave a Nb/Py specific interface resistance of 6.0 0.5 fΩm2 and Fe20Ni80 resistivity of 174 50 nΩm, consistent with other studies in polycrystalline samples.
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