A New Type 'Magnetic-field' Probe of High Spatial-resolution Based on a Single-layer Flat-coil Method
Abstract
A radically new approach to surface probing based on a replacement of the solid-state near-field probes by the 'long-field' ones is presented and discussed. Such probes may enable to create a radically new generation microscopes with non-perturbing long-range action probe based on a highly sensitive RF test method with a single-layer flat coil. This may give a start for creation of a new direction in microscopy.
0
Turn this paper into a full lesson
ArcXiv compiles a staged curriculum from this paper: 8-12 lessons across beginner → advanced, synthesised section guides, visuals, flashcards, a quiz, exercises, and on-demand deep dives per section. Grounded in the abstract, never invented.