Multiple Time Scales in Diffraction Measurements of Diffusive Surface Relaxation
Abstract
We grew SrTiO3 on SrTiO3 (001) by pulsed laser deposition, using x-ray scattering to monitor the growth in real time. The time-resolved small angle scattering exhibits a well-defined length scale associated with the spacing between unit cell high surface features. This length scale imposes a discrete spectrum of Fourier components and rate constants upon the diffusion equation solution, evident in multiple exponential relaxation of the "anti-Bragg" diffracted intensity. An Arrhenius analysis of measured rate constants confirms that they originate from a single activation energy.
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