Structural dichroism in the antiferromagnetic insulating phase of V$_2$O$_3$

Abstract

We performed near-edge x-ray absorption spectroscopy (XANES) at V K edge in the antiferromagnetic insulating (AFI) phase of a 2.8% Cr-doped V$_2$O$_3$ single crystal. Linear dichroism of several percent is measured in the hexagonal plane and found to be in good agreement with ab-initio calculations based on multiple scattering theory. This experiment definitively proves the structural origin of the signal and therefore solves a controversy raised by previous interpretations of the same dichroism as non-reciprocal. It also calls for a further investigation of the role of the magnetoelectric annealing procedure in cooling to the AFI phase.