X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling
H. Ott, C. Schuessler-Langeheine, E. Schierle, A. Yu. Grigoriev, V. Leiner, H. Zabel, G. Kaindl, E. Weschke
Abstract
Quantitative analyses of x-ray scattering from thin films of Ho and Dy metal at the M5 resonances result in values of the optical constants and the magnetic scattering lengths fm, with fm as large as 200 r0. The observation of first- and second-order magnetic satellites allows to separate fm into circular and linear dichroic contributions. This high magnetic sensitivity, in conjunction with the tunable x-ray probing depth across the resonance can be applied to monitor depth profiles of complex magnetic structures, as e.g. of helical antiferromagnetic domains in a Dy metal film.
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