Spin flip scattering at Al surfaces

Abstract

Non-local measurements are performed on a multi terminal device to $in-situ$ determine the spin diffusion length and in combination with resistivity measurements also the spin relaxation time in Al films. By varying the thickness of Al we determine the contribution to spin relaxation from surface scattering. From the temperature dependence of the spin diffusion length it is established that the spin relaxation is impurity dominated at low temperature. A comparison of the spin and momentum relaxation lengths for different thicknesses reveals that the spin flip scattering at the surfaces is weak compared to that within the bulk of the Al films.