Dynamic properties in a family of competitive growing models
Claudio M. Horowitz, Ezequiel V. Albano
Abstract
The properties of a wide variety of growing models, generically called X/RD, are studied by means of numerical simulations and analytic developments. The study comprises the following X models: Ballistic Deposition, Random Deposition with Surface Relaxation, Das Sarma-Tamboronea, Kim-Kosterlitz, Lai-Das Sarma, Wolf-Villain, Large Curvature, and three additional models that are variants of the Ballistic Deposition model. It is shown that after a growing regime, the interface width becomes saturated at a crossover time (tx2) that, by fixing the sample size, scales with p according to tx2(p) p-y, (p > 0), where y is an exponent. Also, the interface width at saturation (Wsat) scales as Wsat(p) p-δ, (p > 0), where δ is another exponent. It is proved that, in any dimension, the exponents δ and y obey the following relationship: δ= y βRD, where βRD = 1/2 is the growing exponent for RD. Furthermore, both exponents exhibit universality in the p 0 limit. By mapping the behaviour of the average height difference of two neighbouring sites in discrete models of type X/RD and two kinds of random walks, we have determined the exact value of the exponent δ. Finally, by linking four well-established universality classes (namely Edwards-Wilkinson, Kardar-Parisi-Zhang, Linear-MBE and Non-linear-MBE) with the properties of both random walks, eight different stochastic equations for all the competitive models studied are derived.
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