A single intrinsic Josephson junction with double-sided fabrication technique
Abstract
We make stacks of intrinsic Josephson junctions (IJJs) imbedded in the bulk of very thin (d≤ 100~nm) Bi2Sr2CaCu2O8+x single crystals. By precisely controlling the etching depth during the double-sided fabrication process, the stacks can be reproducibly tailor-made to be of any microscopic height (0-9 nm <d), i.e. enclosing a specified number of IJJ (0-6), including the important case of a single junction. We discuss reproducible gap-like features in the current-voltage characteristics of the samples at high bias.
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