A single intrinsic Josephson junction with double-sided fabrication technique
L. X. You, M. Torstensson, A. Yurgens, D. Winkler, C. T. Lin, B. Liang
Abstract
We make stacks of intrinsic Josephson junctions (IJJs) imbedded in the bulk of very thin (d≤ 100~nm) Bi2Sr2CaCu2O8+x single crystals. By precisely controlling the etching depth during the double-sided fabrication process, the stacks can be reproducibly tailor-made to be of any microscopic height (0-9 nm <d), i.e. enclosing a specified number of IJJ (0-6), including the important case of a single junction. We discuss reproducible gap-like features in the current-voltage characteristics of the samples at high bias.
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