Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature
Julien Senzier, Pengshun S. Luo, Hervé Courtois
Abstract
We demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60 mK). This local probe uses a quartz tuning fork ensuring high tunnel junction stability. We performed the spatially-resolved spectroscopic study of a superconducting nano-circuit patterned on an insulating substrate. Significant deviations from the BCS prediction are observed.
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