Influence of structural disorder on low-temperature behavior of penetration depth in electron-doped high-TC thin films
Abstract
To probe the influence of structural disorder on low-temperature behavior of magnetic penetration depth in electron-doped high-TC superconductors, a comparative study of high-quality Pr1.85Ce0.15CuO4 (PCCO) and Sm1.85Ce0.15CuO4 (SCCO) thin films is presented. The obtained results confirm a d-wave pairing mechanism in both samples, substantially modified by impurity scattering (which is more noticeable in less homogeneous SCCO films) at the lowest temperatures. The value of the extracted impurity scattering rate correlates with the quality of our samples and is found to be much higher in less homogeneous films with lower TC.
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