Characterizing electron entanglement in multiterminal mesoscopic conductors

Abstract

We show that current correlations at the exit ports of a beam splitter can be used to detect electronic entanglement for a fairly general input state. This includes the situation where electron pairs can enter the beam splitter from the same port or be separated due to backscattering. The proposed scheme allows to discriminate between occupation-number and degree-of-freedom entanglement.