Real-time observation of oxidation and photo-oxidation of rubrene thin films by spectroscopic ellipsometry
Abstract
We follow in real-time and under controlled conditions the oxidation of the organic semiconductor rubrene grown on SiO2 using spectroscopic ellipsometry. We derive the complex dielectric function epsilon1 + i epsilon2 for pristine and oxidized rubrene showing that the oxidation is accompanied by a significant change of the optical properties, namely the absorption. We observe that photo-oxidation of rubrene is orders of magnitude faster than oxidation without illumination. By following different absorption bands (around 2.5eV and 4.0eV for pristine rubrene and around 4.9eV for oxidized rubrene) we infer that the observed photo-oxidation of these films involves non-Fickian diffusion mechanisms.
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