Conductance Distributions in Random Resistor Networks: Self Averaging and Disorder Lengths
R. F. Angulo, E. Medina
Abstract
The self averaging properties of conductance g are explored in random resistor networks with a broad distribution of bond strengths P(g)μ-1. Distributions of equivalent conductances are estimated numerically on hierarchical lattices as a function of size L and distribution tail parameter μ. For networks above the percolation threshold, convergence to a Gaussian basin is always the case, except in the limit μ --> 0. A disorder length ξD is identified beyond which the system is effectively homogeneous. This length diverges as ξD |μ|-ν (ν is the regular percolation correlation length exponent) as μ-->0. This suggest that exactly the same critical behavior can be induced by geometrical disorder and bu strong bond disorder with the bond occupation probability p<-->μ. Only lattices at the percolation threshold have renormalized probability distribution in a Levy-like basin. At the threshold the disorder length diverges at a vritical tail strength μc as |μ-μc|-z, with z=3.2 0.1, a new exponent. Critical path analysis is used in a generalized form to give form to give the macroscopic conductance for lattice above pc.
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