Scaling regimes and critical dimensions in the Kardar-Parisi-Zhang problem
Erwin Frey, Uwe C. T"auber, Hans-Karl Janssen
Abstract
We study the scaling regimes for the Kardar-Parisi-Zhang equation with noise correlator R(q) ~ (1 + w q-2 ρ) in Fourier space, as a function of ρand the spatial dimension d. By means of a stochastic Cole-Hopf transformation, the critical and correction-to-scaling exponents at the roughening transition are determined to all orders in a (d - dc) expansion. We also argue that there is a intriguing possibility that the rough phases above and below the lower critical dimension dc = 2 (1 + ρ) are genuinely different which could lead to a re-interpretation of results in the literature.
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