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Maximum Metallic Conductivity in Si-MOS Structures

V. M. Pudalov, G. Brunthaler, A. Prinz, G. Bauer

cond-mat.str-elarXiv:cond-mat/9812183

Abstract

We found that the conductivity of the two-dimensional electron system in Si-MOS structures is limited to a maximum value, Gmax, as either density increases or temperature decreases. This value Gmax is weakly disorder dependent and ranging from 100 to 140 e2/h for samples whose mobilities differ by a factor of 4.

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