The effect of substrate induced strain on the charge-ordering transition in Nd0.5Sr0.5MnO3 thin films
Abstract
We report the synthesis and characterization of Nd0.5Sr0.5MnO3 thin films grown by the Pulsed Laser Deposition technique on 100 -oriented LaAlO3 substrates. X-ray diffraction (XRD) studies show that the films are 101 -oriented, with a strained and quasi-relaxed component, the latter increasing with film thickness. We observe that transport properties are strongly dependent on the thickness of the films. Variable temperature XRD down to 100 K suggests that this is caused by substrate induced strain on the films.
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