The effect of substrate induced strain on the charge-ordering transition in Nd0.5Sr0.5MnO3 thin films
W. Prellier, Amlan Biswas, M. Rajeswari, T. Venkatesan, R. L. Greene
Abstract
We report the synthesis and characterization of Nd0.5Sr0.5MnO3 thin films grown by the Pulsed Laser Deposition technique on 100 -oriented LaAlO3 substrates. X-ray diffraction (XRD) studies show that the films are 101 -oriented, with a strained and quasi-relaxed component, the latter increasing with film thickness. We observe that transport properties are strongly dependent on the thickness of the films. Variable temperature XRD down to 100 K suggests that this is caused by substrate induced strain on the films.
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