Low Temperature Penetration depth of κ-(ET)2Cu[N(CN)2]Br and κ-(ET)2Cu(NCS)2
A. Carrington, I. J. Bonalde, R. Prozorov, R. W. Giannetta, A. M. Kini, J. Schlueter, H. H. Wang, U. Geiser, J. M. Williams
Abstract
We present high precision measurements of the penetration depth λof single crystals of κ-(ET)2Cu[N(CN)2]Br and κ-(ET)2Cu(NCS)2 at temperature down to 0.4 K. We find that, at low temperatures, the in-plane penetration depth varies as a fractional power law, λ T1.5. W hilst this may be taken as evidence for novel bose excitation processes, we show that the data are also consistent with a quasi-linear variation of the superfluid density, as is expected for a d-wave superconductor with impurities. Our data for the interplane penetration depth show similar features and give a direct measurement of the absolute value, λ(0)=100 20 μm.
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