Universal conductance fluctuations in three dimensional metallic single crystals of Si
Arindam Ghosh, A. K. Raychaudhuri
Abstract
In this paper we report the measurement of conductance fluctuations in single crystals of Si made metallic by heavy doping (n ≈ 2-2.5nc, nc being critical composition at Metal-Insulator transition). Since all dimensions (L) of the samples are much larger than the electron phase coherent length Lϕ(L/Lϕ 103), our system is truly three dimensional. Temperature and magnetic field dependence of noise strongly indicate the universal conductance fluctuations (UCF) as predominant source of the observed magnitude of noise. Conductance fluctuations within a single phase coherent region of Lϕ3 was found to be saturated at <(δGϕ)2> ≈ (e2/h)2. An accurate knowledge of the level of disorder, enables us to calculate the change in conductance δG1 due to movement of a single scatterer as δG1 e2/h, which is 2 orders of magnitude higher than its theoretically expected value in 3D systems.
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