Charge carrier density collapse in La0.67Ca0.33MnO3 and La0.67Sr0.33MnO3 epitaxial thin films
W. Westerburg, F. Martin, G. Jakob, P. J. M. van Bentum, J. A. A. J. Perenboom
Abstract
We measured the temperature dependence of the linear high field Hall resistivity of La0.67Ca0.33MnO3 (TC=232K) and La0.67Sr0.33MnO3 (TC=345K) thin films in the temperature range from 4K up to 360K in magnetic fields up to 20T. At low temperatures we find a charge carrier density of 1.3 and 1.4 holes per unit cell for the Ca- and Sr-doped compound, respectively. In this temperature range electron-magnon scattering contributes to the longitudinal resistivity. At the ferromagnetic transition temperature TC a dramatic drop in the number of current carriers n down to 0.6 holes per unit cell, accompanied by an increase in unit cell volume, is observed. Corrections of the Hall data due to a non saturated magnetic state will lead a more pronounced charge carrier density collapse.
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