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Charge carrier density collapse in La0.67Ca0.33MnO3 and La0.67Sr0.33MnO3 epitaxial thin films

W. Westerburg, F. Martin, G. Jakob, P. J. M. van Bentum, J. A. A. J. Perenboom

cond-mat.mtrl-sciarXiv:cond-mat/9907346

Abstract

We measured the temperature dependence of the linear high field Hall resistivity of La0.67Ca0.33MnO3 (TC=232K) and La0.67Sr0.33MnO3 (TC=345K) thin films in the temperature range from 4K up to 360K in magnetic fields up to 20T. At low temperatures we find a charge carrier density of 1.3 and 1.4 holes per unit cell for the Ca- and Sr-doped compound, respectively. In this temperature range electron-magnon scattering contributes to the longitudinal resistivity. At the ferromagnetic transition temperature TC a dramatic drop in the number of current carriers n down to 0.6 holes per unit cell, accompanied by an increase in unit cell volume, is observed. Corrections of the Hall data due to a non saturated magnetic state will lead a more pronounced charge carrier density collapse.

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