Charge fluctuations and dephasing in coulomb coupled conductors

Abstract

It is shown that the dephasing rate in Coulomb coupled mesoscopic structures is determined by charge relaxation resistances. The charge relaxation resistance together with the capacitance determines the RC-time of the mesoscopic structure and at small frequencies determines the voltage fluctuation spectrum. Self-consistent expressions are presented which give the charge relaxation resistance and consequently the dephasing rate in terms of the diagonal and off-diagonal elements of a generalized Wigner-Smith delay-time matrix. Dephasing rates are discussed both for the equilibrium state and in the transport state in which charge fluctuations are generated by shot noise. A number of different geometries are discussed. This article is to appear in {\it Quantum Mesoscopic Phenomena and Mesoscopic Devices}, edited by I. O. Kulik and R. Ellialtioglu, (Kluwer, unpublished).