GaAs Microstrip Testbeam Results
S. Gowdy
Abstract
A gallium arsenide detector was tested with a beam of 70GeV pions at the SPS at CERN. The detector utilises a novel biasing scheme which has been shown to behave as expected. The detector has a pitch of 50μm and therefore an expected resolution of 14.5μm. The measured resolution was approximately 14μm. By using a non-linear charge division algorithm this can be increased to ≈ 12μm. Noise was the limiting factor to the resolution. This was 2000e- as opposed to the expected 360e-. This noise is also thought to have reduced the detection efficiency of the detector. The source of the excess noise is currently being investigated.
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