ELECTRONIC STRUCTURE OF FeSi
V. R. Galakhov, E. Z. Kurmaev, V. M. Cherkashenko, Yu. M. Yarmoshenko, S. N. Shamin, A. V. Postnikov, St. Uhlenbrock, M. Neumann, Z. W. Lu, Barry M. Klein, Zhu-Pei Shi
Abstract
The full set of high-energy spectroscopy measurements including X-ray photoelectron valence band spectra and soft X-ray emission valence band spectra of both components of FeSi (Fe Kbeta5, Fe Lalpha, Si Kbeta1,3 and Si L2,3) are performed and compared with the results of ab-initio band structure calculations using the linearized muffin-tin orbital method and linearized augmented plane wave method.
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