Measurements of RF Cavity Voltages by X-ray Spectrum Measurements
J. P. Duke, A. P. Letchford, D. J. S. Findlay
Abstract
Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.
Create a lesson
Related papers
Single-pass stochastic cooling for electron microscopy
River Robles, Peter Hommelhoff
Impact of Rapid Acceleration on Beam Dynamics in the Rapid-Cycling Synchrotrons of a Muon Collider
Lisa Soubirou, Antoine Chancé
LADA: A differential algebra-based simulation package for arbitrary-order charged-particle and light optics
Dmitry Varentsov, Sergey Litvinov, Maksym Miski-Oglu et al.
Transverse Confinement in Cascaded Inverse-Cherenkov Acceleration via Phase-Trajectory Control and Injection Matching
Yuanhao Liu, Nanshun Huang, Xionghao Yuan et al.
OPALX: A performance-portable framework for particle accelerator simulations
Michail Zampetakis, Ryan Sean Ammann, Yuanjie Bi et al.
Intrabeam scattering of chirped electron bunches with non-Gaussian longitudinal distributions and slice mismatch
Xiuji Chen, Wencai Cheng, Si Chen et al.