Rayleigh scattering, mode coupling, and optical loss in silicon microdisks
Matthew Borselli, Kartik Srinivasan, Paul E. Barclay, Oskar Painter
Abstract
High refractive index contrast optical microdisk resonators fabricated from silicon-on-insulator wafers are studied using an external silica fiber taper waveguide as a wafer-scale optical probe. Measurements performed in the 1500 nm wavelength band show that these silicon microdisks can support whispering-gallery modes with quality factors as high as 5.2 x 105, limited by Rayleigh scattering from fabrication induced surface roughness. Microdisks with radii as small as 2.5 microns are studied, with measured quality factors as high as 4.7 x 105 for an optical mode volume of 5.3 cubic wavelengths in the material.
Create a lesson
Related papers
Engineering Color and Angular Stability in Building-Integrated Photovoltaics Using Metal-Oxide Photonic Glasses
Sinan Genc, Talat Ozden, Alpan Bek
Probing topological edge states in multilayer dielectric photonic nanostructures
Eva Otero, Ivan Toftul, Michael Scalora et al.
Mode locking by phase-sensitive amplification
Francesco De Lucia, Yifan Sun, Georges Semaan et al.
Continuous-wave 148.4 nm Generation in Quasi-phase Matched BaMgF4
Yuanzhuang Bu, Xiangting Wang, Ruiyin Gu et al.
Continuous-wave 148.4-nm generation in strontium tetraborate for nuclear absorption spectroscopy
Hanlin Wang, Zhouzhi Tan, Conghui Huang et al.
Orbital Angular Momentum Transfer and Beam-Quality Limits in Fork-Grating Electron Diffraction
P. K. Tsiopa, S. S. Baturin