Electromagnetic forces for an arbitrary optical trapping of a spherical dielectric

Abstract

Analytical solution for optical trapping force on a spherical dielectric particle for an arbitrary positioned focused beam is presented in a generalized Lorenz-Mie and vectorial diffraction theory. In this case the exact electromagnetic field is considered in the focal region. A double tweezers setup was employed to perform ultra sensitive force spectroscopy and observe the forces, demonstrating the selectively couple of the transverse electric (TE), transverse magnetic (TM) modes by means of the beam polarization and positioning, and to observe correspondent morphology-dependent resonances (MDR) as a change in the optical force. The theoretical prediction of the theory agrees well with the experimental results. The algorithm presented here can be easily extended to other beam geometries and scattering particles.