Investigation of the Casimir force between metal and semiconductor test bodies
F. Chen, U. Mohideen, G. L. Klimchitskaya, V. M. Mostepanenko
Abstract
The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be significantly different than between two similar or dissimilar metals.
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