Titanium Nitride Films for Ultrasensitive Microresonator Detectors

Abstract

Titanium nitride (TiNx) films are ideal for use in superconducting microresonator detectors because: a) the critical temperature varies with composition (0 < Tc < 5 K); b) the normal-state resistivity is large, n ~ 100 μOhm cm, facilitating efficient photon absorption and providing a large kinetic inductance and detector responsivity; and c) TiN films are very hard and mechanically robust. Resonators using reactively sputtered TiN films show remarkably low loss (Qi > 107) and have noise properties similar to resonators made using other materials, while the quasiparticle lifetimes are reasonably long, 10-200 μs. TiN microresonators should therefore reach sensitivities well below 10-19 WHz(-1/2).

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