A diffraction effect in X-ray area detectors

Abstract

When an X-ray area detector based on a single crystalline material, for instance, a state of the art hybrid pixel detector, is illuminated from a point source by monochromatic radiation, a pattern of lines appears which overlays the detected image. These lines can be easily found by scattering experiments with smooth patterns, such as small-angle X-ray scattering. The origin of this effect is the Bragg reflection in the sensor layer of the detector. Experimental images are presented over a photon energy range from 3.4 keV to 10 keV, together with a theoretical analysis. The intensity of this pattern is up to 20%, which can disturb the evaluation of scattering and diffraction experiments. The patterns can be exploited to check the alignment of the detector surface with the direct beam, and the alignment of individual detector modules with each other in the case of modular detectors, as well as for the energy calibration of the radiation.