CDF Run II Silicon Vertex Detector Annealing Study

Abstract

Between Run II commissioning in early 2001 and the end of operations in September 2011, the Tevatron collider delivered 12~fb$^{-1}$ of $p\bar{p}$ collisions at $\sqrt{s}=1.96$ TeV to the Collider Detector at Fermilab (CDF). During that time, the CDF silicon vertex detector was subject to radiation doses of up to 12 Mrad. After the end of operations, the silicon detector was annealed for 24 days at $18^{\circ}$C. In this paper, we present a measurement of the change in the bias currents for a subset of sensors during the annealing period. We also introduce a novel method for monitoring the depletion voltage throughout the annealing period. The observed bias current evolution can be characterized by a falling exponential term with time constant $\tau_I=17.88\pm0.36$(stat.)$\pm0.25$(syst.) days. We observe an average decrease of $(27\pm3)\%$ in the depletion voltage, whose evolution can similarly be described by an exponential time constant of $\tau_V=6.21\pm0.21$ days. These results are consistent with the Hamburg model within the measurement uncertainties.