New Limits on Double Electron Capture of 40Ca and 180W
Abstract
We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40Ca with T1/22v2K>9.9×1021 y and T1/20v2EC>1.4×1022 y and for 180W with T1/22v2K>3.1×1019 y and T1/20v2EC>9.4×1018 y at 90% CL. Depending on the process, these values improve the currently best limits by a factor of 1.4-30.
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