A new method to reduce the statistical and systematic uncertainty of chance coincidence backgrounds measured with waveform digitizers

Abstract

A new method for measuring chance-coincidence backgrounds during the collection of coincidence data is presented. The method relies on acquiring data with near-zero dead time, which is now realistic due to the increasing deployment of flash electronic-digitizer (waveform digitizer) techniques. An experiment designed to use this new method is capable of acquiring more coincidence data, and a much reduced statistical fluctuation of the measured background. A statistical analysis is presented, and used to derive a figure of merit for the new method. Factors of four improvement over other analyses are realistic. The technique is illustrated with preliminary data taken as part of a program to make new measurements of the prompt fission neutron spectra at Los Alamos Neutron Science Center. It is expected that the these measurements will occur in a regime where the maximum figure of merit will be exploited.