Re-evaluation of uncertainty for calibration of 100 M and 1 G resistors at NPL

Abstract

The uncertainty for calibrating 100 M and 1 G resistors using the NPL high-resistance CCC bridge has been re-evaluated, resulting in combined uncertainties of 0.1 μ/ , considerably smaller than the CMC entries of 0.4 μ/ and 1.6 μ/ respectively. This re-evaluation supports measurement of single electron pump currents with combined uncertainties of a few parts in 107.

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