High-Precision Contactless Optical 3D-Metrology of Silicon Sensors
Abstract
We describe a setup and procedures for contactless optical 3D-metrology of silicon micro-strip sensors. Space points are obtained by video microscopy and a high precision XY-table. The XY-dimensions are obtained from the movement of the table and pattern recognition, while the Z-dimension results from a Fast Fourier Transformation analyses of microscopic images taken at various distances of the optical system from the object under investigation. The setup is employed to measure the position of silicon sensors mounted onto a carbon fibre structure with a precision of a few microns.
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