A study in using MICROMEGAS to improve particle identification with the TAMU-MDM focal plane detector
Abstract
A MICROMEGAS detection amplifier has been incorporated into the design of the TAMU MDM focal plane detector with the purpose of improving the energy resolution and thus, the particle identification. Beam tests showed a factor of 2 improvement over the original design, from 10-12% to 4-6%, for ions with A<40 at E/A around 10-20 MeV.
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