Removal of 210Pb by Etch of Crystalline Detector Sidewalls
Abstract
A potential source of dominant backgrounds for many rare-event searches or screening detectors is from radon daughters, specifically 210Pb, deposited on detector surfaces, often during detector fabrication. Performing a late-stage etch is challenging because it may damage the detector. This paper describes a late-stage etching technique that reduces surface 210Pb and 210Po by >99× at 90% C.L.
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