Determination of the light exposure on the photodiodes of a new instrumented baffle for the Virgo input mode cleaner end-mirror

Abstract

As part of the upgrade program of the Advanced Virgo interferometer, the installation of new instrumented baffles surrounding the main test masses is foreseen. As a demonstrator, and to validate the technology, the existing baffle in the area of the input mode cleaner end-mirror will be first replaced by a baffle equipped with photodiodes. This paper presents detailed simulations of the light distribution on the input mode cleaner baffle, with the aim to determine the light exposure of the photodiodes under different scenarios of the interferometer operation.