Pixelated silicon detector for radiation beam profile measurements

Abstract

A pixelated silicon detector, developed originally for particle physics experiments, was used for a beam profile measurement of a Co-60 irradiator in a water phantom. The beam profile was compared to a profile measured with a pinpoint ionization chamber. The differences in the pixel detector and pinpoint chamber relative profiles were within approximately 0.02, and after calculating correction factors with Monte Carlo simulations for the pixel detector, the differences were decreased to almost less than 0.005. The detector's capability to measure pulse-height was used to record an electron pulse-height spectrum in water in the Co-60 beam, and the results agreed well with simulations.