Frequency Dependence of Subsurface Flaws Detection Efficiency via The Total Internal Reflection Ultrasonic Sensor

Abstract

The Total Internal Reflection Ultrasonic Sensor (TIRUS) is a device especially aimed at detecting subsurface flaws in a tested specimen based on the frustrated total internal reflection of bulk ultrasonic waves in the sensor body [1]. In the fabricated experimental sample of the TIRUS a transducer of the sensor emitted a slow shear wave with the velocity ~600 m/s (SSW) into the [110] direction of the TeO2 crystal (Fig. 1) [2]. The sensor design was such that the displacement vector of the SSW lay in the planes of reflecting surfaces of the crystal, that is, it was a shear horizontal (SH) wave with respect to these planes. It was assumed that with such a design no other waves should exist in the crystal except those polarized as the SSW [3]. The total internal reflection of a probing ultrasonic wave incident at the interface between the sensor and a tested object is frustrated if there is a subsurface flaw in the evanescent field under the interface (Fig. 1, a). As a result, the reflected wave is affected, and the sensor output changes.