Theoretical framework for real time sub-micron depth monitoring using quantum inline coherent imaging

Abstract

Inline Coherent Imaging (ICI) is a reliable method for real-time monitoring of various laser processes, including keyhole welding, additive manufacturing, and micromachining. However, the axial resolution is limited to greater than 2 {\mu}m making ICI unsuitable for monitoring submicron processes. Advancements in Quantum Optical Coherence Tomography (QOCT), which uses a Hong-Ou-Mandel (HOM) interferometer, has the potential to address this issue by achieving better than 1 {\mu}m depth resolution. While time-resolved QOCT is slow, Fourier domain QOCT (FD-QOCT) overcomes this limitation, enabling submicron scale real-time process monitoring. Here we review the fundamentals of FD-QOCT and QOCT and propose a Quantum Inline Coherent Imaging system based on FD-QOCT. Using frequency entangled sources available today the system has a theoretical resolution of 0.17 microns, making it suitable for submicron real-time process monitoring.