Review of germanium-silicon single-photon avalanche diodes

Abstract

While it took about a decade for a germanium (Ge) thin film grown on a silicon (Si) substrate to be successfully applied as a detector material for high-speed optical fiber communication application, it took about another decade to further expand its usage as a sensor material for active optical sensing and imaging applications. In this paper, we shall review the progress of a shortwave infrared (SWIR) single-photon detection (SPD) with germanium-silicon (GeSi) single-photon avalanche diode (SPAD), ranging from the first demonstration at cryogenic temperature (Z. Lu et al., 2011) to the recent demonstration at room temperature (N. Na et al, 2024). Potential new applications will also be discussed.