Collection, characterization, and precision measurement of levitated charged nanoparticles

Abstract

We describe apparatus and experimental procedures for high stability precision measurements of levitated nanoscale particles confined in an ion trap in high vacuum. We discuss methods for particle generation and collection using electrospray emission, for rapid characterization by direct imaging of thermal motion, and for transfer of the particle from the trap where it is collected to a separate analysis trap in order to achieve better vacuum and lower noise. In the analysis trap at high vacuum (pressure $p\simeq10^{-8}$ Torr), we employ thermostatic control of the trapped particle oscillation amplitudes, allowing long-term, precision measurements of oscillation frequencies, from which the charge to mass ratio ($Q/M$) can be deduced. Under these conditions, we achieve $Q/M$ measurement precision approaching $10^{-5}$. This sensitivity will enable, for example, investigations of the surface chemistry of $μ$m-scale levitated materials in ultra-high vacuum environments.