Development of a Silicon-Based Ultra-Fast X-Ray Beam Size Monitor for SuperKEKB
Abstract
We present the development of a silicon-based ultra-fast X-ray beam size monitor (SiXRM) for SuperKEKB. The system enables, for the first time at SuperKEKB, bunch-by-bunch measurements of the vertical beam size using synchrotron radiation. The detector combines a silicon strip sensor board, amplifier boards, and fast waveform readout electronics. Beam measurements demonstrate clear reconstruction of the bunch structure and X-ray images for individual bunches. The measured beam sizes show good agreement with those obtained from the existing CMOS-based XRM system. The measurement precision is estimated to be better than 6.4 μm. This system provides a powerful tool for studying beam dynamics and optimizing luminosity in high-luminosity colliders.
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