Quantum metrology with undetected mid-infrared photons for applied non-destructive testing

Abstract

Metrology with undetected photons is an emerging technique that leverages quantum effects and photon correlations (entanglement) to retrieve valuable information in a target spectral range (e.g., mid-infrared, mid-IR) using measurements in an easily accessible domain (e.g., visible, near-IR). The underlying quantum process of spontaneous parametric down-conversion (SPDC) is utilized to generate non-degenerate correlated signal and idler photons to serve as detection and probing photons, respectively. Sensing with undetected photons enables important advantages, such as ultra-low probe powers, room-temperature operation, and shot-noise-limited detection. In this contribution, we apply a quantum nonlinear interferometer based on an SPDC source to perform applied mid-IR spectroscopy, mid-IR microscopy, and mid-IR optical coherence tomography (OCT) as among the most promising techniques for quantum-based routine non-destructive testing. Moreover, we characterize the system, benchmark it against classical systems, and provide a prospective outlook for this new technology.