Cryogenic sapphire oscillator with exceptionally high long-term frequency stability
Abstract
We report on the development of a sapphire cryogenic microwave resonator oscillator long-term fractional frequency stability of 2x10-17Sqrt[τ] for integration times τ>103 s and negative drift of about 2.2x10-15/day. The short-term frequency instability of the oscillator is highly reproducible and also state-of-the-art: 5.6x10-16 for an integration time of τ ~ 20 s.
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