High-Mobility and High-Reliability Top-Gate Oxide Semiconductor Transistors by Oxygen Engineering

Abstract

In this work, we investigate the role of oxygen (O) on the performance of top-gate (TG) atomic-layer-deposited (ALD) oxide semiconductor transistors. The results reveal distinct defect characteristics and positive bias temperature instability (PBTI) degradation mechanisms between oxygen-rich (O-rich) and oxygen-deficient (O-poor) devices. It is found that an O-rich device fabrication process followed by O-free annealing can effectively achieve TG indium-rich (In-rich) oxide semiconductor transistors with high mobility, high reliability and high stability in hydrogen environment because O-rich process can suppress oxygen vacancies and their interaction with hydrogen, while O-free annealing plays a critical role in minimizing the formation of O-rich defects such as oxygen dimers (O-O bonds). Consequently, TG In-rich transistors with high mobility, steep subthreshold slope, and high PBTI reliability at high temperature are demonstrated. The understanding of O-rich defects provides a new insight to overcome the mobility-stability trade-off.