Contactless terahertz mapping of wafer-scale superconducting NbTiN thin films

Abstract

For large-scale superconducting quantum technology, e.g. quantum computing, the homogeneity of wafer-scale superconducting thin films is vital for consistent performance of the fabricated devices. Terahertz (THz) spectroscopy as a contactless and non-destructive measurement technique is a powerful tool to characterize the superconducting films. In this work, a set of niobium titanium nitride (NbTiN) thin films on 4-inch and 6-inch silicon wafers, grown via plasma-enhanced magnetron sputtering, are investigated via THz spectroscopy: full wafers are mapped at room temperatures and exemplary segments are characterized at cryogenic temperatures. The deviations in observed sheet resistance depend on the used deposition device and the film thickness. While the deviations in superconducting sheet kinetic inductance match those of the normal-state sheet resistance, the critical temperature and energy gap exhibit little variation. This THz mapping technique demonstrates the feasibility of evaluating wafer-scale superconducting thin films before lithography, facilitating preparation of the thin films for reproducible device fabrication.