Hardware-efficient erasure-error detection with an integer fluxonium

Abstract

Erasure-error detection can improve the efficiency of quantum error correction by revealing the times and locations of their error events. In this work, we demonstrate erasure conversions and mid-circuit erasure detections in a single integer fluxonium, in which the states $\mathrm{|g\rangle, |f\rangle}$ encode the logical states and $\mathrm{|e\rangle}$ encodes the erasure state. The integer fluxonium suppresses direct $|\mathrm{f} \rangle \rightarrow |\mathrm{g} \rangle$ transitions and allows the dominant $|\mathrm{f} \rangle \rightarrow |\mathrm{e}\rangle$ transitions to be converted into detectable erasures. Furthermore, we identified a design space that nullifies the resonant-frequency shift between the two logical states, enabling ancilla-free mid-circuit erasure checks using the same resonator employed for final readout. By discarding the detected erasure events, we achieved an 8.4-fold increase in the $|\mathrm{f}\rangle$ state lifetime, a 1.38-fold increase in the Hahn-echo time, and a reduction of single-qubit gate error from 0.061(2)% to 0.030(5)%. Our results establish integer fluxonium as a hardware-efficient platform for erasure-error detection and conversion, while identifying the improvements required to realize an effective erasure qubit with high erasure bias.